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These extremely accurate microrules are ideally suited for direct measurement of two-dimensional parts as well as axial calibration of optical measuring systems and two-dimensional X-Y stages that would normally require extensive set-up and expensive capital equipment. The dual scale English/Metric pattern allows the user to accurately extrapolate measurements to a fraction of the smallest division on either scale. Scale patterns are in direct contact with the part being measured and the measurements are taken directly by the user through the viewing magnifiers. Because of this, there are no off-scale reading errors or compensating adjustments required, as is the case with indirect, off-axis reading systems. Included rail-mounted magnifiers allow the user to re-check set points (two with 25" version) without touching work surface or moving anything on the microrule. Includes a storage case and NIST traceable Certificate of Accuracy. Dimensions: 2.50" W max, 0.71" H max (side rails only), 1.46 - 1.58" H w/magnifier. Construction: Durable double-layer chrome deposit on 0.225" thick float glass, fully supported by low reflection aluminum extrusion side rails and end caps to protect the glass from damage during normal shop use.
Copyright year, Edmund Optics Inc.
18 Woodlands Loop #04-00, Singapore 738100