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900 - 1700nm, InGaAs NIR Spectrometer

Stock #15-499
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Model Number:
BTC261P 900-1700nm
Input Port Termination:
Type of Sensor:
TE-Cooled 512-Element InGaAs Linear Array
Wavelength Range (nm):
900 - 1700
Slit Height (μm):
Optical Bench:
Crossed Czerny-Turner
Spectrograph f/#:
Ruled Diffraction Grating: 150 Grooves/mm, Blazed @ 1250nm
Integration Time:
200μs - 64s
Pixel Size, H x V (μm):
25 x 500
Dynamic Range:
100,000:1 (High Dynamic Range Mode) 6,250:1 (High Sensitivity Mode)
Operating System:
Windows® 7, 8, 8.1, 10 (32-bit and 64-bit)
Computer Interface:
USB 2.0
Power Input:
Via AC to DC Power Supply: 100 - 240VAC 50/60 Hz, 0.5A @ 120VAC to 5V DC @ 3.5A
Digital I/O:
Via Aux Port
Operating Temperature (°C):
0 to +35
Weight (lbs):
Digitizer Speed (kHz):
Resolution (nm):
Slit Width (μm):
TE Cooling (°C):
Dimensions (inches):
7.8 W x 4.3 H x 2.7 L
Data Transfer Speed:
>200 spectra per second
Software included. 0.22 NA fiber patch cord is recommended, sold separately.

Regulatory Compliance


Product Family Description

  • Wide Spectral Response Ranges
  • High Resolution, Sensitivity, and Dynamic Range
  • Thermo-Electric Cooling (TEC) for Low Dark Noise
  • UV and Visible Spectrometers Also Available

InGaAs NIR Spectrometers offer high sensitivity and dynamic range and utilize high performance linear InGaAs sensors with thermo-electric cooling (TEC) to achieve low dark noise for demanding NIR applications. Each spectrometer features an SMA905 termination for fiber optic input with high speed USB 2.0 readout and auxiliary GPIO ports. With configurable sensor operation modes and integration times of 200μs to greater than 64sec, these NIR spectrometers can detect even the weakest infrared signals. Typical applications include chemometrics and absorption spectroscopy, chemical, mineral and moisture analysis, telecommunication, laser characterization, coarse ellipsometry, produce inspection, and defense.

InGaAs NIR Spectrometers come complete with data acquisition software. The software provides functions of single or continuous data acquisitions in raw, dark subtracted, transmission/reflectance and absorbance modes, as well as advanced features such as timeline recording, data smoothing, background subtraction, peak analysis and much more.