Infrared (IR) and Ultraviolet (UV) Viewers

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Near Infrared (NIR) Detection YAGLASS-T Filters Near Infrared (NIR) Detection YAGLASS-T Filters
  • Convert NIR Light to Visible Light
  • Minimum Sensitivity of 30mW/mm2 @ 1064nm for Emission
  • Ideal Alternative to Laser Detection Cards for High Power Applications
  • Fluorescent Glass Filters for Converting UV to Visible Light Also Available
High Resolution 1550nm Converter for CCD Cameras High Resolution 1550nm Converter for CCD Cameras
  • Converter Extends Standard CCD Cameras into IR (1495 - 1595nm)
  • Device for Imaging or Alignment Applications
High Power Laser Beam Visualizers High Power Laser Beam Visualizers
  • Laser Beam Detection from the UV to the NIR
  • High Laser Damage Threshold
  • Ideal for Alignment of CW and Pulsed Lasers
Infrared (IR) Handheld Devices Infrared (IR) Handheld Devices
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New Clearance
  • View IR Light Sources and Align IR Lasers
  • Bright, High Contrast Images
  • Accepts C-Mount Lenses
Laser Detection Products Laser Detection Products
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  • Full Spectrum Coverage: UV, VIS, IR Series
  • 3 Mounted Formats Have Safe, Non-reflective Encapsulation
  • Unique, No Pre-charge for IR Detection and No Fading During Use
  • Flexibility for Either Transmission or Reflective Viewing
ZAP-IT® Laser Alignment Paper ZAP-IT® Laser Alignment Paper
  • Industrial Standard Beam Profile Viewing Paper
  • Records Beam Shape, Divergence, Mode, and Intensity Profile of Pulsed Lasers
  • Suitable for Broadband Sources from UV to IR
IRis™ High Power Laser Detection Wand IRis™ High Power Laser Detection Wand New
  • 1460 – 1600nm Wavelength Range
  • Lightweight and Portable
  • Lanyard Clip for Hands Free Portability

Infrared (IR) and Ultraviolet (UV) Viewers are used to visualize the Infrared (IR) and Ultraviolet (UV) laser beams. Infrared (IR) and Ultraviolet (UV) Viewers are able to convert invisible radiation into a visible image. Infrared (IR) and Ultraviolet (UV) Viewers offer increased performance and safety to Infrared (IR) and Ultraviolet (UV) laser applications by reducing problems such as beam visualization, profiling, or alignment.

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