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Laser Beam Analysis

Laser Beam Analysis technology is used to measure the attributes of a laser beam in order to test its usefulness or compatibility for different laser applications. Laser Beam Analysis includes devices such as profiler systems that evaluate data from beam images to provide information such as beam location, peak intensity position, stability, or beam density. Laser Beam Analysis systems offer a range of information as well as a greater amount of control over many laser applications by delivering detailed information about a tested laser.

Haas Laser Technologies BWA-CAM M² Analyzer Cameras Haas Laser Technologies BWA-CAM M² Analyzer Cameras New
  • Real-Time Analysis of Laser Beam Caustic, M², Centroid, Ellipticity, and Astigmatism
  • Compatible with CW and Pulsed Lasers with Single-Pulse Capability
  • Ideal for Laser Development, Quality Control, and Optical System Monitoring
  • Complies with ISO 11146 and ISO 13694
Haas Laser Technologies BA-CAM Beam Analyzer Cameras Haas Laser Technologies BA-CAM Beam Analyzer Cameras New
  • Analysis of Beam Profile, Centroid, Ellipticity, Clip Levels, Flatness Factor, Plateau Uniformity
  • Supports CW and Pulsed Laser Sources
  • Ideal for Laser System Diagnostics and Process Optimization
  • Compliant with ISO 13694 Spatial Beam Metrics
Mesa Photonics FROGScan Ultrafast Pulse Measurement System Mesa Photonics FROGScan Ultrafast Pulse Measurement System New
  • Compatible with Ultrafast Pulses Ranging from 12fs to 20ps
  • User Swappable SHG Crystal with No Realignment Required
  • VideoFROGScan Software Provides Real-Time Measurements
DataRay M² Measurement Systems DataRay M² Measurement Systems New
  • ISO11146 Compliant
  • 355 - 1150nm or 2000 - 16000nm Wavelength Options
  • 50mm and 200mm Travel Options
DataRay CMOS Beam Profilers DataRay CMOS Beam Profilers New
  • Designed for Use from 355 to 1150nm
  • Compatible with Beam Diameters Down to 52µm
  • Robust and Easy to Use Free Software Provided
  • Measure Beam Wander, M², Divergence, and More
DataRay Scanning Slit Beam Profilers DataRay Scanning Slit Beam Profilers
  • Designed For Use From 190 to 1150nm
  • Measure Beam Diameters of 2µm to 4mm
  • Robust Easy to Use Software Provided
Edmund Optics® Beam Profilers Edmund Optics® Beam Profilers
Top Seller
  • High Resolution for Accurate Small Beam Profile Measurements
  • Large Area Sensor for Large Beam Profiling
  • USB 3.0 for the Fastest Transfer Rates
#11-760 Edmund Optics TPA Ultrafast Autocorrelator by APE (700-1100nm) Edmund Optics Ultrafast Autocorrelator by APE
  • Trusted APE® Performance with Same Day Availability
  • TPA Detector with >0.1W2 Sensitivity @ 700 - 1100nm
  • Includes a Controller with USB Interface and Ready to Use Data Acquisition Software
  • Compact Design and Tuning Free Wavelength Matching
  • Ideal for Low and High Repetition Rate Ultrafast Lasers
Coherent® Lasercam™ Beam Profiler Coherent® Lasercam™ Beam Profiler
  • 12 and 14-bit Digital USB 2.0 Interface Options
  • High Sensitivity and Dynamic Range
  • Intuitive BeamView™ Software Included
CamIR 1550nm NIR USB 3.1 Cameras CamIR 1550nm NIR USB 3.1 Cameras
Top Seller
  • 1550nm Designed Wavelength
  • Phosphor Coated Camera Sensor
  • Includes Camera, Cable, and Easy-to-Use Software
  • UV Versions Available
CamUV 200nm UV USB 3.1 Cameras CamUV 200nm UV USB 3.1 Cameras New
  • Ideal for a Variety of Ultraviolet (UV) Imaging Applications
  • 200nm Designed Wavelength
  • Phosphor Coated Camera Sensor
  • Includes Camera, Cable, and Easy-to-Use Software
  • NIR Versions Available

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