Optical Manufacturing

Superpolishing Manufacturing

Minimize Scatter with Ultra-Low Surface Roughness
RMS Surface Roughness <1Å
Standard Sizes and Shapes from 12.7 to 50.8mm
Custom Sizes and Shapes Upon Request
Supported by State-of-the-Art Metrology
Parts-per-Million Level Scattering

Overview

Edmund Optics^® is an industry leader in superpolishing optics for ultra-low surface roughness. Superpolished optics minimize scatter and are ideal for laser optics applications where throughput is critical. This technology complements Edmund Optics’ low-loss coatings, which utilize ion beam sputtering (IBS), because coating performance is often limited by the roughness of the glass substrates. Our expert coating and manufacturing engineers can develop a customized solution for your system and guide you throughout your entire product development process. World-class metrology ensures that all superpolished surfaces meet your application needs. What can we make for you?

Capabilities

Superpolishing Capabilities*
RMS Surface Roughness**	<1Å
Surface Accuracy	<0.1λ
Parallelism (Diameter < 12.7mm)	<1 arcsec
Parallelism (Diameter ≥ 12.7mm)	<30 arcsec
Surface Quality	10-5 (Over Clear Aperture)
Diameter	6 – 50.8mm
Materials	Fused Silica

*Tighter specifications are achievable upon request.
** ≤1 RMS as measured using an optical profiler using a 20x objective at a spatial frequency bandwidth of 9 to 250 cycles per mm. RMS (root mean square) and P-V (peak-to-valley) specifications are calculated from the same set of data, but P-V describes the difference between the highest and lowest data points while RMS describes the mathematical average of a data set.

ON DEMAND WEBINAR

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Ultra-Low Surface Roughness
Polishing & Metrology

To learn more about the fabrication and measurement of superpolished optics, view our on demand webinar.

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Manufacturing Equipment

Planetary Polishers modified for submersion polishing
Coating Chambers, including Ion Beam Sputtering (IBS)

Learn about the fabrication process for our superpolished surfaces in our SPIE conference proceedings.

Metrology

Zygo^® NewView White Light InterferometersInterferometers are instruments used to measure small displacements, refractive index changes, and surface irregularities. They split light from a single source into two separate beams that travel different optical paths before recombining. Interference fringes are then formed, which provides information on the difference in optical path length between the two paths. Interferometers are often used to measure the surface accuracy of optics.
Zygo^® VeriFire™ High Resolution Interferometers
Park Systems XE-100 Atomic Force Microscope (AFM) Atomic force microscopes (AFM) measure a sample's surface topography with atomic resolution by scanning an extremely small and sharp tip across the surface. This 3D reconstruction of the surface is used to quantify surface roughness.

Learn about the metrology for our superpolished surfaces in our SPIE conference proceedings.

Videos

Informative corporate or instructional videos ranging from simple tips to application-based demonstrations of product advantages.

Introduction to Laser Optics Lab

Metrology at Edmund Optics: Measuring as a Key Component of Manufacturing

Application Notes

Technical information and application examples including theoretical explanations, equations, graphical illustrations, and much more.

Metrology for Laser Optics
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Subsurface Damage
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Trending in Optics

The future depends on optics through technological and application advancements. Edmund Optics® continues to embrace the future by providing information on trending products and technologies.

Superpolished Optics
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Webinars

Recorded webinars from Edmund Optics® experts on a wide range of optics and imaging topics.

Ultra-Low Surface Roughness Polishing and Metrology
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Published Articles

Links to technical articles appearing in industry publications authored by Edmund Optics^® or featuring contributions from Edmund Optics' engineering team and key management.

Fabrication of ultralow-roughness surfaces: The Beilby layer
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White-light interferometry resolves sub-Angstrom surface roughness
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Standard Products

Standard superpolished products are in-stock and ready to ship. Contact us to discuss custom options tailored for your application.

Superpolished Substrates
IBS Laser Line Mirrors
IBS Laser Line Windows

Superpolished Substrates

Both Surfaces Superpolished with ≤1Å RMS Surface Roughness
Low Scatter Surfaces Ideal for UV or High-Power Laser Applications
UV Fused Silica Substrates with Polished Bevels and Edges
In-House Manufacturing Enables Custom Sizes and Shapes from 6 to 76.2mm and Surface Roughness <0.5Å

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